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Clusters on Surfaces and Cluster Assembled Materials

Clusters on Surfaces and Cluster Assembled Materials
Contact:

Artur Böttcher

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Soft-landing deposition of mass selected cluster ions onto UHV clean single crystal surfaces can be used to explore the properties of novel cluster materials - as a function of the size and composition of the building blocks. We characterize the temperature dependent properties of the resulting deposits over a wide range of coverages using in-situ surface-sensitive spectroscopic tools including photoelectron spectroscopy (XPS/UPS), thermal desorption spectroscopy with mass spectral detection (TDS) and vibrational spectroscopy (Raman and IRAS). Ex-situ analysis methods encompass scanning probe microscopy (including low temperature STM) as well as high resolution, aberration corrected electron microscopy - each performed in collaboration and often involving vacuum transfer. Presently we are interested in the physical and chemical properties of novel all-carbon materials comprising fullerenes with reactive annelated pentagon ring sites.

 

"Properties of non-IPR fullerene films versus size of the building blocks”, Daniel Löffler, Seyithan Ulas, Stefan-Sven Jester, Patrick Weis, Artur Böttcher and Manfred M. Kappes, Phys. Chem. Chem. Phys., 2010, 12, 10671-10684.